Abstract
A statistical method of the design of experiments and analysis of variance (ANOVA) was used to obtain optimized sputtering conditions for oriented ZnS thin films doped with 5% manganese on glass substrates. The effects on the five sputtering factors-substrate temperature, radio frequency power, sputtering pressure, sputtering time, and pre-sputtering time-were simultaneously investigated by using the design of experiments and ANOVA. Through only 16 experiments, it was proved statistically at the 5% level that the substrate temperature was the only significant control factor. ZnS films were then deposited under the optimized sputtering conditions on fused quartz and thermally annealed in a reducing ambient (5% H2 diluted in Ar) at 500, 600, 700, and 800°C. It was found that the crystallinity and triboluminescence intensity of the films were enhanced by postannealing up to 700°C.
| Original language | English |
|---|---|
| Pages (from-to) | 959-963 |
| Number of pages | 5 |
| Journal | Journal of Materials Research |
| Volume | 17 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - May 2002 |
| Externally published | Yes |
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