The potential for spatial ability development through the Swedish technology and craft compulsory curricula

Ting Jun Lin, Jeffrey Buckley, Lena Gumaelius, Ernest Ampadu

Research output: Contribution to journalArticlepeer-review

Abstract

Spatial ability has been demonstrated to be a significant predictor of students’ achievement in science, technology, engineering, and mathematics education. While several studies have focused on offering supplementary or isolated spatial training interventions, this study focuses on spatial ability development through embedded interventions within technology curricula. Specifically, document analysis is adopted in this study to identify the potential areas for spatial ability development within the Swedish compulsory Technology and Craft curricula. A framework consisting of two dimensions has been established by a qualitative coding approach. The first dimension, termed the “visual dimension”, encompasses graphical, property, and manufactured components, reflecting the spatial nature of the information that students engage with. The second dimension, termed the “epistemic dimension”, comprises conceptual and procedural knowledge, representing the types of knowledge students acquire. The framework allows educators to identify potential areas for developing spatial ability within technology curricula. Additionally, it is envisioned that this framework could increase awareness of how to spatialise curriculum and pedagogies among various stakeholders, including policymakers and teacher trainers.

Original languageEnglish
JournalInternational Journal of Technology and Design Education
DOIs
Publication statusAccepted/In press - 2024
Externally publishedYes

Keywords

  • Document analysis
  • National curriculum
  • Spatial ability
  • Swedish compulsory education
  • Technology education

Fingerprint

Dive into the research topics of 'The potential for spatial ability development through the Swedish technology and craft compulsory curricula'. Together they form a unique fingerprint.

Cite this