@inproceedings{01bb5f10253f46378165ee3828bb5155,
title = "Removal of inclusions from solar grade silicon using electromagnetic field",
abstract = "The characteristics of the top-cut solar grade silicon (SoG-Si) scraps produced from SoG-Si ingots were investigated using optical microscope observation, SEM-EDS analysis and automatic inclusion scanning (ASPEX). Particles of SiC and Si3N4 are the main non-metallic inclusions in the SoG silicon top-cut scrap. The deeper into the scrap from the surface, the less and smaller inclusions are found. A laboratory-scale electromagnetic purification unit was used to melt the silicon scraps and remove inclusions from the melt. The experimental results indicated that the electromagnetic (EM) field efficiently pushed the non-metallic particles and less-conductive metallic impurity elements to the boundary layer.",
keywords = "Electromagnetic field, Inclusions, Solar cell silicon",
author = "Anping Dong and Damoah, {Lucas N.W.} and Hui Zhu and Lifeng Zhang and Chenlei Wang",
year = "2011",
doi = "10.1002/9781118062111.ch77",
language = "English",
isbn = "9781118029459",
series = "TMS Annual Meeting",
publisher = "Minerals, Metals and Materials Society",
pages = "669--676",
booktitle = "Materials Processing and Energy Materials",
}