Removal of inclusions from solar grade silicon using electromagnetic field

Anping Dong, Lucas N.W. Damoah, Hui Zhu, Lifeng Zhang, Chenlei Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

The characteristics of the top-cut solar grade silicon (SoG-Si) scraps produced from SoG-Si ingots were investigated using optical microscope observation, SEM-EDS analysis and automatic inclusion scanning (ASPEX). Particles of SiC and Si3N4 are the main non-metallic inclusions in the SoG silicon top-cut scrap. The deeper into the scrap from the surface, the less and smaller inclusions are found. A laboratory-scale electromagnetic purification unit was used to melt the silicon scraps and remove inclusions from the melt. The experimental results indicated that the electromagnetic (EM) field efficiently pushed the non-metallic particles and less-conductive metallic impurity elements to the boundary layer.

Original languageEnglish
Title of host publicationMaterials Processing and Energy Materials
PublisherMinerals, Metals and Materials Society
Pages669-676
Number of pages8
ISBN (Print)9781118029459
DOIs
Publication statusPublished - 2011
Externally publishedYes

Publication series

NameTMS Annual Meeting
Volume1

Keywords

  • Electromagnetic field
  • Inclusions
  • Solar cell silicon

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