High frequency electromagnetic purification of silicon

Lucas Nana Wiredu Damoah; Lifeng Zhang

doi:10.1002/9781118359341.ch59

High frequency electromagnetic purification of silicon

Lucas Nana Wiredu Damoah, Lifeng Zhang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

The use of electromagnetic field to remove suspended particles from metals such as aluminum by pushing to the boundary has been well studied. However, the potential of this method is yet to be exploited for the removal of inclusions from silicon. Considering the increasing amount of Top-cut SoG-Si scraps year upon year, mere is the need to harness all the potentials of technologies to recycle this materials to ensure sustainability. This study investigates, and discusses new results on the effect of processing parameters such as composition, coil current, and frequency on the removal of inclusions from silicon under high frequency AC electromagnetic field.

Original language	English
Title of host publication	Extraction and Processing Division - 2012 EPD Congress - Held During the TMS 2012 Annual Meeting and Exhibition
Publisher	Minerals, Metals and Materials Society
Pages	499-506
Number of pages	8
ISBN (Print)	9781118291405
DOIs	https://doi.org/10.1002/9781118359341.ch59
Publication status	Published - 2012
Externally published	Yes
Event	2012 EPD Congress - TMS 2012 Annual Meeting and Exhibition - Orlando, FL Duration: 11 Mar 2012 → 15 Mar 2012

Publication series

Name	TMS Annual Meeting

Conference

Conference	2012 EPD Congress - TMS 2012 Annual Meeting and Exhibition
Country/Territory	United States
City	Orlando, FL
Period	11/03/12 → 15/03/12

Keywords

Electromagnetic purification
Inclusions
Silicon

Access to Document

10.1002/9781118359341.ch59

Cite this

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title = "High frequency electromagnetic purification of silicon",

abstract = "The use of electromagnetic field to remove suspended particles from metals such as aluminum by pushing to the boundary has been well studied. However, the potential of this method is yet to be exploited for the removal of inclusions from silicon. Considering the increasing amount of Top-cut SoG-Si scraps year upon year, mere is the need to harness all the potentials of technologies to recycle this materials to ensure sustainability. This study investigates, and discusses new results on the effect of processing parameters such as composition, coil current, and frequency on the removal of inclusions from silicon under high frequency AC electromagnetic field.",

keywords = "Electromagnetic purification, Inclusions, Silicon",

author = "Damoah, {Lucas Nana Wiredu} and Lifeng Zhang",

year = "2012",

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language = "English",

isbn = "9781118291405",

series = "TMS Annual Meeting",

publisher = "Minerals, Metals and Materials Society",

pages = "499--506",

booktitle = "Extraction and Processing Division - 2012 EPD Congress - Held During the TMS 2012 Annual Meeting and Exhibition",

note = "2012 EPD Congress - TMS 2012 Annual Meeting and Exhibition ; Conference date: 11-03-2012 Through 15-03-2012",

}

Damoah, LNW & Zhang, L 2012, High frequency electromagnetic purification of silicon. in Extraction and Processing Division - 2012 EPD Congress - Held During the TMS 2012 Annual Meeting and Exhibition. TMS Annual Meeting, Minerals, Metals and Materials Society, pp. 499-506, 2012 EPD Congress - TMS 2012 Annual Meeting and Exhibition, Orlando, FL, United States, 11/03/12. https://doi.org/10.1002/9781118359341.ch59

High frequency electromagnetic purification of silicon. / Damoah, Lucas Nana Wiredu; Zhang, Lifeng.
Extraction and Processing Division - 2012 EPD Congress - Held During the TMS 2012 Annual Meeting and Exhibition. Minerals, Metals and Materials Society, 2012. p. 499-506 (TMS Annual Meeting).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Damoah, Lucas Nana Wiredu

AU - Zhang, Lifeng

PY - 2012

Y1 - 2012

N2 - The use of electromagnetic field to remove suspended particles from metals such as aluminum by pushing to the boundary has been well studied. However, the potential of this method is yet to be exploited for the removal of inclusions from silicon. Considering the increasing amount of Top-cut SoG-Si scraps year upon year, mere is the need to harness all the potentials of technologies to recycle this materials to ensure sustainability. This study investigates, and discusses new results on the effect of processing parameters such as composition, coil current, and frequency on the removal of inclusions from silicon under high frequency AC electromagnetic field.

AB - The use of electromagnetic field to remove suspended particles from metals such as aluminum by pushing to the boundary has been well studied. However, the potential of this method is yet to be exploited for the removal of inclusions from silicon. Considering the increasing amount of Top-cut SoG-Si scraps year upon year, mere is the need to harness all the potentials of technologies to recycle this materials to ensure sustainability. This study investigates, and discusses new results on the effect of processing parameters such as composition, coil current, and frequency on the removal of inclusions from silicon under high frequency AC electromagnetic field.

KW - Electromagnetic purification

KW - Inclusions

KW - Silicon

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DO - 10.1002/9781118359341.ch59

M3 - Conference contribution

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BT - Extraction and Processing Division - 2012 EPD Congress - Held During the TMS 2012 Annual Meeting and Exhibition

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ER -

High frequency electromagnetic purification of silicon

Abstract

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Conference

Keywords

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