TY - JOUR
T1 - Charge transport measurements in compressed bulk graphene oxide
AU - Onwona-Agyeman, Boateng
AU - Sun, Yong
AU - Hattori, Hayami
N1 - Publisher Copyright:
© Carl Hanser Verlag GmbH & Co. KG.
PY - 2021
Y1 - 2021
N2 - Charge transport measurements in compressed bulk graphene oxide (GO) have been studied within the temperature range 15 – 450 K. Structural properties and surface morphologies of the bulk compressed GO were studied using X-ray diffraction and transmission electron microscopy. Raman and X-ray photoelectron spectroscopies were also used to confirm the presence of graphitic phases and the various functional groups in the GO, respectively. Current–voltage characteristics of the GO measured with gold (Au) electrodes at different temperatures showed no Schottky barrier at the Au/GO interface. At low temperatures and low bias voltages, the electron transport through the compressed GO sample showed no significant voltage dependence, which is consistent with a direct tunneling mechanism at all the bias voltages (0.01 – 1.0 V). It was also observed that no Fowler–Nordheim transport mechanism occurred within this bias voltage range.
AB - Charge transport measurements in compressed bulk graphene oxide (GO) have been studied within the temperature range 15 – 450 K. Structural properties and surface morphologies of the bulk compressed GO were studied using X-ray diffraction and transmission electron microscopy. Raman and X-ray photoelectron spectroscopies were also used to confirm the presence of graphitic phases and the various functional groups in the GO, respectively. Current–voltage characteristics of the GO measured with gold (Au) electrodes at different temperatures showed no Schottky barrier at the Au/GO interface. At low temperatures and low bias voltages, the electron transport through the compressed GO sample showed no significant voltage dependence, which is consistent with a direct tunneling mechanism at all the bias voltages (0.01 – 1.0 V). It was also observed that no Fowler–Nordheim transport mechanism occurred within this bias voltage range.
KW - Bias voltage
KW - Compressed graphene oxide
KW - Raman spectroscopy
KW - X-ray photoelectron spectroscopy
UR - http://www.scopus.com/inward/record.url?scp=85200455334&partnerID=8YFLogxK
U2 - 10.1515/IJMR-2020-1110704
DO - 10.1515/IJMR-2020-1110704
M3 - Article
AN - SCOPUS:85200455334
SN - 1862-5282
VL - 111
SP - 552
EP - 558
JO - International Journal of Materials Research
JF - International Journal of Materials Research
IS - 7
ER -